[svn-r25401] add serial and parallel regression tests for zero dset read/write bug.
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@@ -237,6 +237,7 @@ extern int dxfer_coll_type;
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/* Test program prototypes */
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void test_plist_ed(void);
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void zero_dim_dset(void);
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void multiple_dset_write(void);
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void multiple_group_write(void);
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void multiple_group_read(void);
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