[svn-r25401] add serial and parallel regression tests for zero dset read/write bug.

This commit is contained in:
Mohamad Chaarawi
2014-07-09 14:01:25 -05:00
parent 6d637e03f7
commit 92cc75bfae
4 changed files with 137 additions and 0 deletions

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@@ -237,6 +237,7 @@ extern int dxfer_coll_type;
/* Test program prototypes */
void test_plist_ed(void);
void zero_dim_dset(void);
void multiple_dset_write(void);
void multiple_group_write(void);
void multiple_group_read(void);